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Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash...
Yachen Kong, Meng Zhang, Xuepeng Zhan, Rui Cao, Jiezhi Chen: Retention Correlated Read Disturb Errors in 3-D Charge Trap NAND Flash Memory: Observations, Analysis, and Solutions. IEEE Trans. Comput....
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Dual-Point Technique for Multi-Trap RTN Signal Extraction.
Xuepeng Zhan, Yifang Xi, Qianwen Wang, Weiqiang Zhang, Zhigang Ji, Jiezhi Chen: Dual-Point Technique for Multi-Trap RTN Signal Extraction. IEEE Access 8: 88141-88146 (2020)
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Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory...
Yifang Xi, Xiaotong Fang, Yachen Kong, Yifan Guo, Hongzhe Lin, Xuepeng Zhan, Jiezhi Chen: Bits Mapping in Triple-level-cell (TLC) Charge-trap (CT) 3D NAND Flash Memory and its Applications to IoT...
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Flash memory based computing-in-memory system to solve partial differential...
Yang Feng, Fei Wang, Xuepeng Zhan, Yuan Li, Jiezhi Chen: Flash memory based computing-in-memory system to solve partial differential equations. Sci. China Inf. Sci. 64(6) (2021)
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Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in...
Kenie Xie, Pena Guo, Fei Chen, Binglu Chen, Xiaotong Fang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen: Large Suppression to Lateral Charge Migration (LCM) Related Error Bits in Charge-Trap TLC 3D NAND Flash....
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Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D...
Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen: Work-in-Progress: High-Precision Short-Term Lifetime Prediction in TLC 3D NAND Flash Memory as...
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Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in...
Menghua Jia, Yachen Kong, Xuepeng Zhan, Meng Zhang, Fei Wu, Jiezhi Chen: Optimal Program-Read Schemes Toward Highly Reliable Open Block Operations in 3-D Charge-Trap NAND Flash Memory. IEEE Trans....
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Voltage and temperature dependence of Random Telegraph Noise and their...
Mingtao Xu, Bo Chen, Qi Jin, Lu Tai, Xuepeng Zhan, Jiezhi Chen: Voltage and temperature dependence of Random Telegraph Noise and their impacts on random number generator. Microelectron. J. 125: 105450...
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Insights of VG-dependent threshold voltage fluctuations from dual-point...
Xuepeng Zhan, Jiezhi Chen, Zhigang Ji: Insights of VG-dependent threshold voltage fluctuations from dual-point random telegraph noise characterization in nanoscale transistors. Sci. China Inf. Sci....
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Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program...
Xiaohuan Zhao, Shaoqi Yang, Kenie Xie, Yang Feng, Qianwen Wang, Pengpeng Sang, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen: Error Bits Recovering in 3D NAND Flash Memory: A Novel State-Shift Re-Program (SRP)...
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Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic...
Junyao Mei, Bo Chen, Pengpeng Sang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen: Opto-Electronic Monolayer ZnO Memristor Produced via Low Temperature Atomic Layer Deposition. ICTA 2023: 53-54
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Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory...
Zhichao Du, Chuanxue Sun, Xiaoyu Dou, Pengpeng Sang, Xuepeng Zhan, Chengji Jin, Jixuan Wu, Jiezhi Chen: Simulation for the Feasibility of IGZO Channel in 3D Vertical FeFET Memory Based on TCAD. ICTA...
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High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as...
Xiaotong Fang, Meng Zhang, Yifan Guo, Fei Chen, Binglu Chen, Xuepeng Zhan, Jixuan Wu, Fei Wu, Jiezhi Chen: High-Precision Short-Term Lifetime Prediction in TLC 3-D NAND Flash Memory as Hot-Data...
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Dual-pulse disturb-free programming scheme for FeFET based neuromorphic...
Shuhao Wu, Bo Chen, Chengcheng Wang, Junyao Mei, Maoying Bai, Xuepeng Zhan, Jixuan Wu, Junshuai Chai, Hao Xu, Xiaolei Wang, Jiezhi Chen: Dual-pulse disturb-free programming scheme for FeFET based...
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Operation Scheme Optimizations to Achieve Ultra-high Endurance (1010) in...
Yang Feng, Zhaohui Sun, Chengcheng Wang, Xinyi Guo, Junyao Mei, Yueran Qi, Jing Liu, Junyu Zhang, Jixuan Wu, Xuepeng Zhan, Jiezhi Chen: Operation Scheme Optimizations to Achieve Ultra-high Endurance...
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One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D...
Shaoqi Yang, Xiaohuan Zhao, Kenie Xie, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen: One-shot Read Processing to Enhance Cold Data Retention in Charge-trap TLC 3D NAND Flash. ASICON 2023: 1-4
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Flash-based Computing-in-memory Architectures with High-accuracy and Robust...
Yang Feng, Yueran Qi, Xuepeng Zhan, Jixuan Wu, Jiezhi Chen: Flash-based Computing-in-memory Architectures with High-accuracy and Robust Reliabilities for General-purpose Applications. ASICON 2023: 1-4
View ArticleNear-threshold-voltage operation in flash-based high-precision...
Yang Feng, Bing Chen, Mingfeng Tang, Yuerang Qi, Maoying Bai, Chengcheng Wang, Hai Wang, Xuepeng Zhan, Junyu Zhang, Jing Liu, Jixuan Wu, Jiezhi Chen: Near-threshold-voltage operation in flash-based...
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